Capacitance-voltage (C-V) testing is widely used to determine semiconductor parameters, particularly in MOSCAP and MOSFET structures. However, other types of semiconductor devices and technologies ...

Capacitive displacement sensors turn tiny gaps into actionable signals. By measuring changes in capacitance as target moves, these devices deliver precise, non-contact readings of position and motion.

Capacitive displacement sensors span a wide range of resolution, from the touchscreen sensors which can only detect displacement as a binary state, all the way to the sensors in semiconductor fabs ...

Scanning microwave microscopy (SMM) is a scanning probe method that uses the S11 parameter to calculate the local tip-sample microwave impedance. This impedance is affected by the sample’s local ...