Handling timing exception paths in ATPG tools while creating at-speed patterns has always been a tough and tricky task. It is well understood that at-speed testing is a requirement for modern ...

Both scan automated test pattern generation (ATPG) patterns and IJTAG patterns 1,2,3 are created for a piece of logic that is part of a much larger design. For both, the patterns are independent from ...

Design patterns are used to solve common design problems in software development and to reduce the complexities in our source code. Design patterns can be creational (related to object creation), ...

SystemVerilog supports templates for generic code writing using parameterized classes. Here we’re going to describe some of the design patterns in the code that make up the UVM base class library.

With performance optimizations seemingly having lost their relevance in an era of ever-increasing hardware performance, there are still many good reasons to spend some time optimizing code. In a ...

It’s no secret that a successful yield ramp directly impacts integrated circuit (IC) product cost and time-to-market. Tools and techniques that help companies ramp to volume faster, while also ...